S Lhostis: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Characterization of crystalline MOCVD SrTiO3 films on SiO2/Si(100)

A. Sibai, S. Lhostis, Y. Rozier, O. Salicio, S. Amtablian, C. Dubois, J. Legrand, J.P. Sénateur, M. Audier, L. Hubert-Pfalzgraff, C. Dubourdieu, F. Ducroquet

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 263 KB

english, 2005

2

[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Reliable 300 mm Wafer Level Hybrid Bonding for 3D Stacked CMOS Image Sensors

Lhostis, S., Farcy, A., Deloffre, E., Lorut, F., Mermoz, S., Henrion, Y., Berthier, L., Bailly, F., Scevola, D., Guyader, F., Gigon, F., Besset, C., Pellissier, S., Gay, L., Hotellier, N., Le Berrigo,

Year:

2016

Language:

english

File:

PDF, 690 KB

english, 2016

3

Understanding of the thermal stability of the hafnium oxide/TiN stack via 2 “high k” and 2 metal deposition techniques

V. Cosnier, P. Besson, V. Loup, L. Vandroux, S. Minoret, M. Cassé, X. Garros, J-M. Pedini, S. Lhostis, K. Dabertrand, C. Morin, C. Wiemer, M. Perego, M. Fanciulli

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 582 KB

english, 2007

4

Addition of yttrium into HfO[sub 2] films: Microstructure and electrical properties

Dubourdieu, C., Rauwel, E., Roussel, H., Ducroquet, F., HollaÌnder, B., Rossell, M., Van Tendeloo, G., Lhostis, S., Rushworth, S.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2009

Language:

english

File:

PDF, 1.07 MB

english, 2009

5

Deux cas de GIST gastriques de l’enfant

Minier, F., Perel, Y., Lavrand, F., Lhostis, H., Vergnes, P., Bioulac-Sage, P., Le Bail, B.

Journal:

Annales de Pathologie

Year:

2004

Language:

french

File:

PDF, 57 KB

french, 2004

6

[IEEE 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) - Singapore (2015.12.2-2015.12.4)] 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) - 200 nm Wafer-to-wafer overlay accuracy in wafer level Cu/SiO2 hybrid bonding for BSI CIS

Rebhan, B., Bernauer, M., Wagenleitner, T., Heilig, M., Kurz, F., Lhostis, S., Deloffre, E., Jouve, A., Balan, V., Chitu, L.

Year:

2015

Language:

english

File:

PDF, 606 KB

english, 2015

7

[IEEE 2016 6th Electronic System-Integration Technology Conference (ESTC) - Grenoble, France (2016.9.13-2016.9.15)] 2016 6th Electronic System-Integration Technology Conference (ESTC) - Cu/SiO2 hybrid bonding: Finite element modeling and experimental characterization

Sart, C., Estevez, R., Fiori, V., Lhostis, S., Deloffre, E., Parry, G., Gonella, R.

Year:

2016

Language:

english

File:

PDF, 723 KB

english, 2016

8

[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - 1μm Pitch direct hybrid bonding with

Jouve, A., Balan, V., Bresson, N., Euvrard-Colnat, C., Fournel, F., Exbrayat, Y., Mauguen, G., Sater, M. Abdel, Beitia, C., Arnaud, L., Cheramy, S., Lhostis, S., Farcy, A., Guillaumet, S., Mermoz, S.

Year:

2017

Language:

english

File:

PDF, 170 KB

english, 2017

9

Cu-SiO2 hybrid bonding simulation including surface roughness and viscoplastic material modeling: A critical comparison of 2D and 3D modeling approach

Wlanis, Thomas, Hammer, René, Ecker, Werner, Lhostis, Sandrine, Sart, Clément, Gallois-Garreignot, Sébastien, Rebhan, Bernhard, Maier, Günther A.

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 2.45 MB

english, 2018

10

[IEEE 2018 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2018.12.1-2018.12.5)] 2018 IEEE International Electron Devices Meeting (IEDM) - Hybrid bonding for 3D stacked image sensors: impact of pitch shrinkage on interconnect robustness

Jourdon, J., Lhostis, S., Moreau, S., Chossat, J., Arnoux, M., Sart, C., Henrion, Y., Lamontagne, P., Arnaud, L., Bresson, N., Balan, V., Euvrard, C., Exbrayat, Y., Scevola, D., Deloffre, E., Mermoz,

Year:

2018

Language:

english

File:

PDF, 6 KB

english, 2018

11

[IEEE 2019 6th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D) - Kanazawa, Japan (2019.5.21-2019.5.25)] 2019 6th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D) - Robustness and reliability achievements for direct hybrid bonding integration: a review

Moreau, S., Jourdon, J., Lhostis, S., Bouchu, D., Henrion, Y., Arnaud, L., Jouve, A., Balan, V., Fournel, F., Lamontagne, P., Cheramy, S., Cioccio, L. Di

Year:

2019

Language:

english

File:

PDF, 175 KB

english, 2019

12

Effects of Vortioxetine and Escitalopram on Electroencephalographic Recordings – A Randomized, Crossover Trial in Healthy Males

Nissen, Thomas Dahl, Laursen, Bettina, Viardot, Geoffrey, ĺHostis, Philippe, Danjou, Philippe, Sluth, Lasse B., Gram, Mikkel, Bastlund, Jesper Frank, Christensen, Søren Rahn, Drewes, Asbjørn Mohr

Journal:

Year:

2019

Language:

english

File:

PDF, 1.22 MB

english, 2019

13

Pulsed liquid-injection MOCVD of high-K oxides for advanced semiconductor technologies

C. Dubourdieu, H. Roussel, C. Jimenez, M. Audier, J.P. Sénateur, S. Lhostis, L. Auvray, F. Ducroquet, B.J. O'Sullivan, P.K. Hurley, S. Rushworth, L. Hubert-Pfalzgraf

Journal:

Materials Science and Engineering: B

Year:

2005

Language:

english

File:

PDF, 304 KB

english, 2005

14

Electrical characterization of SrTiO3 thin films deposited on Si(0 0 1) substrate by liquid injection MOCVD

J. Legrand, S. Lhostis, Y. Chang, L. Militaru, C. Lamard, A. Sibai, L. Auvray, M. Audier, J.-P. Sénateur, C. Dubourdieu, F. Ducroquet

Journal:

Microelectronic Engineering

Year:

2004

Language:

english

File:

PDF, 386 KB

english, 2004

15

Impact of the TiN electrode deposition on the HfO2 band gap for advanced MOSFET gate stacks

C. Gaumer, E. Martinez, S. Lhostis, M.-J. Guittet, M. Gros-Jean, J.-P. Barnes, C. Licitra, N. Rochat, N. Barrett, F. Bertin, A. Chabli

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 495 KB

english, 2011

16

Thin film characterization by total reflection x-ray fluorescence

Adrien Danel, Emmanuel Nolot, Marc Veillerot, Ségolène Olivier, Tifenn Decorps, Maria-Luisa Calvo-Muñoz, Jean-Michel Hartmann, Sandrine Lhostis, Hiroshi Kohno, Motoyuki Yamagami, Charles Geoffroy

Journal:

Spectrochimica Acta Part B: Atomic Spectroscopy

Year:

2008

Language:

english

File:

PDF, 585 KB

english, 2008

17

Thin films of the double perovskite Sr2FeMoO6 deposited by pulsed laser deposition

R.P Borges, S Lhostis, M.A Bari, J.J Versluijs, J.G Lunney, J.M.D Coey, M Besse, J.-P Contour

Journal:

Thin Solid Films

Year:

2003

Language:

english

File:

PDF, 646 KB

english, 2003

18

Effect of ion implantation energy for the synthesis of Ge nanocrystals in SiN films with HfO2/SiO2stack tunnel dielectrics for memory application

Bhabani Shankar Sahu, Florence Gloux, Abdelilah Slaoui, Marzia Carrada, Dominique Muller, Jesse Groenen, Caroline Bonafos, Sandrine Lhostis

Journal:

Nanoscale Research Letters

Year:

2011

Language:

english

File:

PDF, 2.55 MB

english, 2011

19

Optimal multichannel estimation of the location of a target with nonoverlapping noise

Campos, J., Lhostis, S., Guillaume, M.

Journal:

Journal of the Optical Society of America A

Year:

2000

Language:

english

File:

PDF, 382 KB

english, 2000

20

[IEEE 2011 Materials for Advanced Metallization (MAM) - Dresden, Germany (2011.05.8-2011.05.12)] 2011 IEEE International Interconnect Technology Conference - Demonstration of Phase Change Memories devices using Ge2Sb2Te5 films deposited by Atomic Layer Deposition

Maitrejean, S., Lhostis, S., Haukka, S., Jahan, C., Gourvest, E., Matero, R., Blomberg, T., Toffoli, A., Persico, A., Jayet, C., Veillerot, M., Barnes, J.P., Pierre, F., Fillot, F., Perniola, L., Sous

Year:

2011

Language:

english

File:

PDF, 2.11 MB

english, 2011

21

Soft X-ray photoemission study of nitrogen diffusion in TiN/HfO:N gate stacks

E. Martinez, C. Gaumer, S. Lhostis, C. Licitra, M. Silly, F. Sirotti, O. Renault

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 1.01 MB

english, 2012

22

Observation of HfO2 thin films by deep UV spectroscopic ellipsometry

F. Ferrieu, K. Dabertrand, S. Lhostis, V. Ivanova, E. Martinez, C. Licitra, G. Rolland

Journal:

Journal of Non-Crystalline Solids

Year:

2007

Language:

english

File:

PDF, 351 KB

english, 2007

23

Evidence of Germanium precipitation in phase-change Ge[sub 1âx]Te[sub x] thin films by Raman scattering

Gourvest, E., Lhostis, S., Kreisel, J., Armand, M., Maitrejean, S., Roule, A., ValleÌe, C.

Journal:

Applied Physics Letters

Year:

2009

Language:

english

File:

PDF, 377 KB

english, 2009

24

Relever le défi du vieillissement de la population

Journal:

NPG Neurologie - Psychiatrie - Gériatrie

Year:

2005

Language:

french

File:

PDF, 54 KB

french, 2005

25

Thermal management of electronic devices by composite materials integrated in silicon

Ollier, Emmanuel, Soupremanien, U., Remondière, V., Dijon, J., Le Poche, H., Seiler, A.L., Lefevre, F., Lips, S., Kinkelin, C., Rolland, N., Rolland, P.A., Zegaoui, M., Lhostis, S., Ancey, P., Descout

Journal:

Microelectronic Engineering

Year:

2014

Language:

english

File:

PDF, 1.76 MB

english, 2014

26

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - The Perovskite SrTiO3 on Si/SiO2 by Liquid Injection MOCVD

Dubourdieu, Catherine, Salicio, Olivier, Lhostis, Sandrine, Auvray, Laurent, Rozier, Yohann, Ducroquet, Frederique, Daniele, Stephane

Year:

2009

Language:

english

File:

PDF, 743 KB

english, 2009

27

On-chip copper–dielectric interference filters for manufacturing of ambient light and proximity CMOS sensors

Frey, Laurent, Masarotto, Lilian, Gros D’Aillon, Patrick, Pellé, Catherine, Armand, Marilyn, Marty, Michel, Jamin-Mornet, Clémence, Lhostis, Sandrine, Le Briz, Olivier

Journal:

Year:

2014

Language:

english

File:

PDF, 858 KB

english, 2014

28

Impact of process factors on the performance of hole array metallic filters

Girard-Desprolet, Romain, Lhostis, Sandrine, Beylier, Charlotte, Farys, Vincent, Vitrant, Guy, Boutami, Salim

Journal:

Applied Physics A: Materials Science & Processing

Year:

2014

Language:

english

File:

PDF, 1.61 MB

english, 2014

29

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Impact of crystallinity of High-k oxides on Vt instabilities of NMOS devices assessed by physical and electrical measurements

Garros, X., Besson, P., Reimbold, G., Loup, V., Salvetat, T., Rochat, N., Lhostis, S., Boulanger, F.

Year:

2008

Language:

english

File:

PDF, 498 KB

english, 2008

30

[IEEE 2012 IEEE International Interconnect Technology Conference - IITC - San Jose, CA, USA (2012.06.4-2012.06.6)] 2012 IEEE International Interconnect Technology Conference - Phase Change Memories challenges: A material and process perspective

Maitrejean, S., Ghezzi, G., Gourvest, E., Beneventi, G. Betti, Fantini, A., Pashkov, N., Navarro, G., Roule, A., Fillot, F., Noe, P., Lhostis, S., Cueto, O., Jahan, C., Nodin, JF, Persico, A., Armand,

Year:

2012

Language:

english

File:

PDF, 504 KB

english, 2012

31

[IEEE 2012 4th Electronic System-Integration Technology Conference (ESTC) - Amsterdam, Netherlands (2012.09.17-2012.09.20)] 2012 4th Electronic System-Integration Technology Conference - Thermal behavior of stack-based 3D ICs

Souare, Papa Momar, de Crecy, Francois, Fiori, Vincent, Ben Jamaa, Haykel, Farcy, Alexis, Gallois-Garreignot, Sebastien, Borbely, Andras, Lhostis, Sandrine, Leduc, Patrick, Cheramy, Severine, Tavernie

Year:

2012

Language:

english

File:

PDF, 1.91 MB

english, 2012

32

[IEEE 2011 IEEE 13th Electronics Packaging Technology Conference - (EPTC 2011) - Singapore, Singapore (2011.12.7-2011.12.9)] 2011 IEEE 13th Electronics Packaging Technology Conference - Performances of Wafer-Level UnderFill with 50µm pitch interconnections: Comparison with conventional underfill

Taluy, Alisee, Lhostis, Sandrine, Jouve, Amandine, Garnier, Gennie, Dezandre, Emilienne, Farcy, Alexis, Cheramy, Severine, Sillon, Nicolas, Sylvestre, Alain

Year:

2011

Language:

english

File:

PDF, 1.39 MB

english, 2011

33

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Carbon-doped GeTe Phase-Change Memory featuring remarkable RESET current reduction

Betti Beneventi, G., Perniola, L., Fantini, A., Blachier, D., Toffoli, A., Gourvest, E., Maitrejean, S., Sousa, V., Jahan, C., Nodin, J.F., Persico, A., Loubriat, S., Roule, A., Lhostis, S., Feldis, H

Year:

2010

Language:

english

File:

PDF, 346 KB

english, 2010

34

Chemical interface analysis of as grown HfO[sub 2] ultrathin films on SiO[sub 2]

Maunoury, C., Dabertrand, K., Martinez, E., Saadoune, M., Lafond, D., Pierre, F., Renault, O., Lhostis, S., Bailey, P., Noakes, T. C. Q., Jalabert, D.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 497 KB

english, 2007

35

[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - New insight on VT stability of HK/MG stacks with scaling in 30nm FDSOI technology

Brunet, L., Garros, X., Casse, M., Weber, O., Andrieu, F., Fenouillet-Beranger, C., Perreau, P., Martin, F., Charbonnier, M., Lafond, D., Gaumer, C., Lhostis, S., Vidal, V., Brevard, L., Tosti, L., De

Year:

2010

Language:

english

File:

PDF, 609 KB

english, 2010

36

Crystallization study of “melt quenched” amorphous GeTe by transmission electron microscopy for phase change memory applications

Bastard, A., Bastien, J. C., Hyot, B., Lhostis, S., Mompiou, F., Bonafos, C., Servanton, G., Borowiak, C., Lorut, F., Bicais-Lepinay, N., Toffoli, A., Sandhya, C., Fantini, A., Perniola, L., Gourvest,

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 866 KB

english, 2011

37

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Interface Study in a "Metal / High-k" Gate Stack: Tantalum Nitride on Hafnium Oxide

Gaumer, Clement, Martinez, Eugenie, Lhostis, Sandrine, Wiemer, Claudia, Perego, Michele, Loup, Virginie, Lafond, Dominique, Fabbri, Jean-Marc

Year:

2008

Language:

english

File:

PDF, 1.77 MB

english, 2008

38

Chemical and Structural Properties of a TaN/HfO[sub 2] Gate Stack Processed Using Atomic Vapor Deposition

Gaumer, C., Martinez, E., Lhostis, S., Wiemer, C., Perego, M., Loup, V., Lafond, D., Fabbri, J.-M.

Journal:

Journal of The Electrochemical Society

Year:

2009

Language:

english

File:

PDF, 817 KB

english, 2009

39

Dielectric Material Options for Integrated Capacitors

Ruhl, G., Lehnert, W., Lukosius, M., Wenger, C., Baristiran Kaynak, C., Blomberg, T., Haukka, S., Baumann, P. K., Besling, W., Roest, A., Riou, B., Lhostis, S., Halimaou, A., Roozeboom, F., Langereis,

Journal:

ECS Journal of Solid State Science and Technology

Year:

2014

Language:

english

File:

PDF, 1.09 MB

english, 2014

40

Electrical and Chemical Properties of the HfO[sub 2]/SiO[sub 2]/Si Stack: Impact of HfO[sub 2] Thickness and Thermal Budget

Martinez, E., Leroux, C., Benedetto, N., Gaumer, C., Charbonnier, M., Licitra, C., Guedj, C., Fillot, F., Lhostis, S.

Journal:

Journal of The Electrochemical Society

Year:

2009

Language:

english

File:

PDF, 355 KB

english, 2009

41

Ultra-Low energy Ion Implantation of Si into HfO2-based layers for Non Volatile Memory Applications

Coulon, Pierre-Eugène, Chan Shin Yu, Kristel, Schamm, Sylvie, Ben Assayag, Gerard, Pécassou, Béatrice, Slaoui, Abdelilah, Bhabani, Sahu, Carrada, Marzia, Lhostis, Sandrine, Bonafos, Caroline

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 1.86 MB

english, 2009

42

Atomic Vapour Deposition (AVD™) Process for High Performance HfO22 Dielectric Layers

Cosnier, V., Dabertrand, K., Blonkowski, S., Lhostis, S., Zoll, S., Morand, Y., Descombes, S., Guillaumot, B., Hobbs, C., Rochat, N., Rolland, G., Renault, O., Garros, X., Cassé, M., Mitard, J., Lehne

Journal:

MRS Proceedings

Year:

2004

Language:

english

File:

PDF, 146 KB

english, 2004

43

Critical Thickness Threshold in HfO2 Layers

Besson, Pascal, Loup, Virginie, Salvetat, Thierry, Rochat, Névine, Lhostis, Sandrine, Favier, Sylvie, Dabertrand, Karen, Cosnier, Vincent

Journal:

Solid State Phenomena

Year:

2008

Language:

english

File:

PDF, 1.86 MB

english, 2008

44

Germanium Surface Passivation Using Ozone Gaseous Phase

Loup, Virginie, Besson, Pascal, Pollet, Olivier, Martinez, Eugénie, Richard, Emmanuelle, Lhostis, Sandrine

Journal:

Solid State Phenomena

Year:

2008

Language:

english

File:

PDF, 291 KB

english, 2008

45

[ECS 213th ECS Meeting - Phoenix, AZ (May 18 - May 23, 2008)] ECS Transactions - Crystalline Structure of HfZrO Thin Films and ZrO2 / HfO2 bi-Layers Grown by AVD for MOS Applications

Lhostis, Sandrine, Gaumer, Clement, Bonafos, Caroline, Schamn, Sylvie, Cherkashin, Nikolay, Pierre, Francois, Fanton, Aurélien, Morin, Christine, Ferrieu, F., Casse, Mikael, Garros, Xavier, Leroux, C

Year:

2008

Language:

english

File:

PDF, 2.36 MB

english, 2008

46

Ultra-Low Energy Ion Implantation of Si into HfO2 and HfSiO-based Structures for Non Volatile Memory Applications

Gloux, Florence, Coulon, Pierre-Eugène, Groenen, Jesse, Schamm, Sylvie, Benassayag, Gerard, Pecassou, Beatrice, Slaoui, Abdelilah, Sahu, Bhabani, Carrada, Marzia, Lhostis, Sandrine, Bonafos, Caroline

Journal:

MRS Proceedings

Year:

2010

Language:

english

File:

PDF, 292 KB

english, 2010

47

Study of crystalline structure N-doped GeSb Phase Change Material for PCRAM applications

Bastard, Audrey, Lhostis, Sandrine, Bonafos, Caroline, Schamm-Chardon, Sylvie, Coulon, Pierre-Eugène, Fillot, Frederic, Ghezzi, Giada, Fantini, Andrea, Perniola, Luca, Loubriat, Sebastien, Roule, Anne

Journal:

MRS Proceedings

Year:

2010

Language:

english

File:

PDF, 414 KB

english, 2010

48

Plasma Enhanced Chemical Vapor Deposition of Conformal GeTe Layer for Phase Change Memory Applications

Gourvest, E., Vallee, C., Michallon, P., Blanc, R., Tiron, R., Jourde, D., Lhostis, S., Maitrejean, S.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2012

Language:

english

File:

PDF, 1.05 MB

english, 2012

49

Impact of Oxidation on Ge2Sb2Te5 and GeTe Phase-Change Properties

Gourvest, E., Pelissier, B., Vallée, C., Roule, A., Lhostis, S., Maitrejean, S.

Journal:

Journal of The Electrochemical Society

Year:

2012

Language:

english

File:

PDF, 257 KB

english, 2012

50

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Electrical and Chemical Properties of the HfO2/SiO2/Si Stack: Impact of HfO2 Thickness and Thermal Budget

Martinez, Eugenie, Leroux, Charles, Benedetto, Nicolas, Gaumer, Clement, Charbonnier, Mathieu, Licitra, Christophe, Guedj, Cyril, Fillot, Frédéric, Lhostis, Sandrine

Year:

2008

Language:

english

File:

PDF, 391 KB

english, 2008

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски